Asymmetric static Fourier-spectrometer for solid surfaces and nano-films study

The optical scheme and functioning of a static Fourier-transform (FT) spectrometer employing surface electromagnetic waves (SEW) is discussed. SEW are excited by the probing radiation on the sample placed in one shoulder of the asymmetric interferometer. Interference pattern (interferogram) carrying...

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Bibliographic Details
Published in:Vibrational spectroscopy 2007-01, Vol.43 (1), p.46-48
Main Authors: Balashov, A.A., Bogomolov, G.D., Kiryanov, A.P., Nikitin, A.K., Pustovoit, V.I., Vaguin, V.A., Zhizhin, G.N.
Format: Article
Language:English
Subjects:
Complex refractive index
Fourier-transform spectrometry
Static interferometer
Surface electromagnetic waves
Time-domain spectroscopy
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Summary:The optical scheme and functioning of a static Fourier-transform (FT) spectrometer employing surface electromagnetic waves (SEW) is discussed. SEW are excited by the probing radiation on the sample placed in one shoulder of the asymmetric interferometer. Interference pattern (interferogram) carrying information about the surface is registered by the detector array, disposed on the ellipse surface. This way of detectors positioning leads to linearization of the phase shift function on the pixels coordinates projection on the ellipse large axis. There are no moving parts in the instrument. That is why it can work as “one pulse spectrometer”. The length of SEW path determines the limiting spectral resolution, while time resolution depends on detector characteristics. The spectrometer provides the possibility of obtaining not only absorption (emission) spectra, but the spectra of complex refraction index as well.
ISSN:0924-2031
1873-3697
DOI:10.1016/j.vibspec.2006.06.008