Surface measurement using active vision and light scattering

This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scatt...

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Bibliographic Details
Published in:Optics and lasers in engineering 2007, Vol.45 (1), p.131-139
Main Authors: Tian, Gui Yun, Lu, Rong Sheng, Gledhill, Duke
Format: Article
Language:English
Subjects:
Active vision
Applied sciences
Artificial intelligence
Computer science
control theory
systems
Diffraction and scattering
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Imaging and optical processing
Light scattering
Optics
Pattern recognition. Digital image processing. Computational geometry
Physics
Speckle and moire patterns
Speckle pattern
Surface measurement
Wave optics
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Summary:This paper reviews the recent progress in surface measurement methods using active vision and light-scattering techniques. The active vision methods with different structured light patterns and the corresponding techniques are summarized. The surface roughness and defects inspection with light-scattering are discussed. After the review, an integrative method to measure surface waviness and form, roughness is proposed.
ISSN:0143-8166
1873-0302
DOI:10.1016/j.optlaseng.2006.03.005