Simultaneous measurement of local film thickness and temperature distribution in wavy liquid films using a luminescence technique

• Published in: International journal of heat and mass transfer 2006-12, Vol.49 (25), p.5049-5061
• Main Authors: Schagen, A., Modigell, M., Dietze, G., Kneer, R.
• Format: Article
• Language: English
• Subjects: Effective heat flux; Exact sciences and technology; Falling film; Fluid dynamics; Fundamental areas of phenomenology (including applications); Hydrodynamic waves; Instrumentation for fluid dynamics; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Local heat transfer coefficient; Physics; Thermal instruments, apparatus and techniques; Thermometry; Wave induced enhancement of heat transfer
• ISSN: 0017-9310; 1879-2189
• DOI: 10.1016/j.ijheatmasstransfer.2006.06.010

Heat transfer in falling liquid film systems is enhanced by waviness. Comprehension of the underlying kinetic phenomena requires experimental data of the temperature field with high spatiotemporal resolution. Therefore a non-invasive measuring method based on luminescence indicators is developed. It is used to determine the temperature distribution and the local film thickness simultaneously. First results are presented for the temperature distribution measurement in a laminar-wavy water film with a liquid side Reynolds number of 126 flowing down a heated plane with an inclination angle of 2°. The measured temperature distributions are used to calculate the local heat transfer coefficient and the convective heat flux perpendicular to the wall for different points in the development of a solitary wave.