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Thickness quality control

This article describes a series of methods to detect thickness defects in DWI tinplate. These methods provide information to identify the origin of the defects, allowing fast corrections and, therefore, improving mill performance. In this approach, an adapted thickness signal is spatially sampled fr...

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Bibliographic Details
Published in:IEEE industry applications magazine 2006-03, Vol.12 (2), p.12-20
Main Authors: Enguita, J.M., Fraga, C., Cuadrado, A.A., Fernandez, Y., Rendueles, J.L., Vecino, G.
Format: Magazinearticle
Language:English
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Summary:This article describes a series of methods to detect thickness defects in DWI tinplate. These methods provide information to identify the origin of the defects, allowing fast corrections and, therefore, improving mill performance. In this approach, an adapted thickness signal is spatially sampled from the input stages of the mill's last X-ray gauge. The system is also able to detect other problems related to thickness quality such as third-octave chatter using only the thickness measures from an X-ray gauge. The usage of this system resulted in an improvement in the factory performance and considerable money savings.
ISSN:1077-2618
1558-0598
DOI:10.1109/MIA.2006.1598022