The study of growth defects in sapphire by laser Rayleigh scattering imaging

We present the technique of laser Rayleigh scattering imaging (LRSI), which has been used for the mapping of inhomogeneities and point defects in sapphire test masses for laser interferometer gravitational wave detectors. We analyse the errors associated with side wall mapping of cylindrical test ma...

Full description

Saved in:
Bibliographic Details
Published in:Journal of optics. A, Pure and applied optics Pure and applied optics, 2004-06, Vol.6 (6), p.635-639
Main Authors: Yan, Zewu, Ju, Li, Gras, Slawomir, Zhao, Chunnong, Blair, David G
Format: Article
Language:English
Subjects:
Biological and medical applications
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Industrial applications
Optics
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present the technique of laser Rayleigh scattering imaging (LRSI), which has been used for the mapping of inhomogeneities and point defects in sapphire test masses for laser interferometer gravitational wave detectors. We analyse the errors associated with side wall mapping of cylindrical test masses, and present the comparison of two samples which show significant differences. The technique could be used to improve quality control in the manufacture of optical materials.
ISSN:1464-4258
1741-3567
DOI:10.1088/1464-4258/6/6/020