Process optimization and characterization of thin films of SrFeO3-x by the pechini method

Nanostructured coatings have recently attracted increasing interest because of the possibilities of synthesizing materials with unique physical-chemical properties. Highly sophisticated surface related properties, such as optical, magnetic, electronic, catalytic, mechanical, chemical and tribologica...

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Bibliographic Details
Published in:Journal of sol-gel science and technology 2006-06, Vol.38 (3), p.271-275
Main Authors: MAJID, Abdul, TUNNEY, Jim, POST, Mike, MARGESON, Jim
Format: Article
Language:English
Subjects:
Aluminum oxide
Annealing
Atomic force microscopy
Catalysis
Chemical properties
Chemical synthesis
Chemistry
Coatings
Colloidal gels. Colloidal sols
Colloidal state and disperse state
Exact sciences and technology
General and physical chemistry
Grain size
Industrial applications
Magnetic properties
Nanostructure
Optical microscopy
Optical properties
Optimization
Organic chemistry
Perovskites
Reagents
Silicon substrates
Spin coating
Thin films
Tribology
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Summary:Nanostructured coatings have recently attracted increasing interest because of the possibilities of synthesizing materials with unique physical-chemical properties. Highly sophisticated surface related properties, such as optical, magnetic, electronic, catalytic, mechanical, chemical and tribological properties can be obtained by advanced nanostructured coatings, making them attractive for various industrial applications. In this report we describe our efforts at developing methodology for the fabrication of SrFeO3-x based thin films using a modified Pechini method. Thin films of SrFeO3-x were fabricated using spin coating and a drop coating method developed in-house on Al2O3 and Si- substrates. The films annealed at 600 deg C for one hour show a perovskite phase. The grain size increases with increase in annealing temperature. The influence of various variables such as metal to chelant ratio, drying control reagents, calcination conditions, substrate type and mode of film formation were studied using XRD, optical microscopy, SEM and AFM.
ISSN:0928-0707
1573-4846
DOI:10.1007/s10971-006-6784-5