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Finite element method parametric study on scratch behavior of polymers

Parametric studies were performed using finite element analysis (FEA) to learn how material and surface properties of polypropylene (PP) affect scratch behavior. Three‐dimensional FEA modeling of scratching on a PP substrate with a spherical‐tipped indenter is presented. Three different loading cond...

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Bibliographic Details
Published in:Journal of polymer science. Part B, Polymer physics Polymer physics, 2007-06, Vol.45 (12), p.1435-1447
Main Authors: Jiang, H., Lim, G. T., Reddy, J. N., Whitcomb, J. D., Sue, H.-J.
Format: Article
Language:English
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Summary:Parametric studies were performed using finite element analysis (FEA) to learn how material and surface properties of polypropylene (PP) affect scratch behavior. Three‐dimensional FEA modeling of scratching on a PP substrate with a spherical‐tipped indenter is presented. Three different loading conditions, that is constant scratch depth, constant normal load, and linearly increasing normal load, are adopted for this parametric study. From the FEA findings, it is learned that Poisson's ratio has a negligible effect on scratch performance, whereas raising the coefficient of adhesive friction induces a significantly larger residual scratch depth and tangential force on the scratch tip. Increasing the Young's modulus of a material does not necessarily improve its overall scratch performance. On the other hand, modifying the yield stress of a material has a major impact on scratch resistance as a higher yield stress reduces the residual scratch depth. From this numerical effort, it is concluded that the yield stress and coefficient of adhesive friction are the most critical parameters to influence the scratch performance of a material. Analyses also suggest that the general trend in the parametric effect of the above four parameters on scratch behavior is independent of the applied normal load level. © 2007 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 45: 1435–1447, 2007
ISSN:0887-6266
1099-0488
DOI:10.1002/polb.21169