Energy dependence of electron energy loss processes in Ge 2s photoemission

Deep core Ge 2s photoelectron spectra from polycrystalline Ge films induced by monochromatic synchrotron radiation, of 4, 6 and 8 keV were measured and analysed using two different methods, the partial intensity analysis and the extended Hüfner method to determine the spectral contributions from dif...

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Bibliographic Details
Published in:Surface science 2007-06, Vol.601 (11), p.2344-2351
Main Authors: Novák, M., Egri, S., Kövér, L., Cserny, I., Drube, W., Werner, W.S.M.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Extrinsic loss
Intrinsic loss
Physics
Surface excitation
X-ray photoelectron spectra
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Summary:Deep core Ge 2s photoelectron spectra from polycrystalline Ge films induced by monochromatic synchrotron radiation, of 4, 6 and 8 keV were measured and analysed using two different methods, the partial intensity analysis and the extended Hüfner method to determine the spectral contributions from different electron energy loss processes due to bulk extrinsic, intrinsic and surface excitations. The obtained photon energy dependence of the ratio of these contributions was compared as a function of the photoelectron kinetic energy. It was found that the relative contribution of intrinsic excitations increase with the photon energy.
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2007.03.039