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Preparation and electrical properties of highly (1 1 1) oriented antiferroelectric PLZST films by radio frequency magnetron sputtering
Highly (1 1 1) oriented lead lanthanum zirconate stannate titanate (PLZST) films were synthesized on Pt/Ti/SiO 2/Si substrates by radio frequency (RF) magnetron sputtering. The microstructure and electrical properties of the films were investigated as a function of post-annealing temperature. Smooth...
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Published in: | Acta materialia 2007-06, Vol.55 (11), p.3923-3928 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Highly (1
1
1) oriented lead lanthanum zirconate stannate titanate (PLZST) films were synthesized on Pt/Ti/SiO
2/Si substrates by radio frequency (RF) magnetron sputtering. The microstructure and electrical properties of the films were investigated as a function of post-annealing temperature. Smooth and crack-free films obtained by post-annealing at 700
°C for 30
min, and exhibit a dense columnar microstructure with a grain size of ∼0.85
μm. The sputtered PLZST films of nominal composition Pb
0.97La
0.02 (Zr
0.60Sn
0.30Ti
0.10)O
3 display a high saturation polarization of ∼70
μC
cm
−2, a low antiferroelectric-to-ferroelectric switching field ( |
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ISSN: | 1359-6454 1873-2453 |
DOI: | 10.1016/j.actamat.2007.03.008 |