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Nano- and macropores in the model for current oscillations at the Si/electrolyte contact
The transition from sustained to damped current oscillations or to stationary behavior is described using a model based on morphological aspects. A roughening of the oxide and of the underlying Si surface is predicted, in accordance with measurements. The role of cracks and nanopores in silicon oxid...
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| Published in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2007-05, Vol.204 (5), p.1245-1249 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3 |
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| cites | cdi_FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3 |
| container_end_page | 1249 |
| container_issue | 5 |
| container_start_page | 1245 |
| container_title | Physica status solidi. A, Applications and materials science |
| container_volume | 204 |
| creator | Grzanna, J. Jungblut, H. Lewerenz, H. J. |
| description | The transition from sustained to damped current oscillations or to stationary behavior is described using a model based on morphological aspects. A roughening of the oxide and of the underlying Si surface is predicted, in accordance with measurements. The role of cracks and nanopores in silicon oxide is discussed with regard to roughness increase and macropore formation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
| doi_str_mv | 10.1002/pssa.200674301 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29906143</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29906143</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3</originalsourceid><addsrcrecordid>eNqFkElPwzAQhS0EElC4cvYFbileUsc5IpaCQCwqCG7WxJkIQxoX2xX03xMoKtw4zYz0vjczj5A9zoacMXE4ixGGgjFV5JLxNbLFtRKZkrxcX_WMbZLtGF8Yy0d5wbfI0zV0PqPQ1XQKNviZDxip62h6Rjr1Nba08YHaeQjYJeqjdW0LyfkuUkjfqok7xBZtCr5dJKTWdwls2iEbDbQRd3_qgDycnd4fn2dXN-OL46OrzEqteaaxxFzKClRV2YLLRvOG2VqXAioQNVplqxzzEbeiFpVmRSNlIUVjR1LVWoEckIOl7yz4tznGZKYuWuyP7NDPoxFlyRTvVwzIcCnsv4wxYGNmwU0hLAxn5itA8xWgWQXYA_s_zhAttE2Azrr4S-mi5FqrXlcude-uxcU_ruZ2Mjn6uyNbsi4m_FixEF6NKmQxMo_XY_N4eaLv1Lgf5CfSvJJD</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29906143</pqid></control><display><type>article</type><title>Nano- and macropores in the model for current oscillations at the Si/electrolyte contact</title><source>Wiley-Blackwell Read & Publish Collection</source><creator>Grzanna, J. ; Jungblut, H. ; Lewerenz, H. J.</creator><creatorcontrib>Grzanna, J. ; Jungblut, H. ; Lewerenz, H. J.</creatorcontrib><description>The transition from sustained to damped current oscillations or to stationary behavior is described using a model based on morphological aspects. A roughening of the oxide and of the underlying Si surface is predicted, in accordance with measurements. The role of cracks and nanopores in silicon oxide is discussed with regard to roughness increase and macropore formation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><identifier>ISSN: 1862-6300</identifier><identifier>ISSN: 0031-8965</identifier><identifier>EISSN: 1862-6319</identifier><identifier>DOI: 10.1002/pssa.200674301</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>05.45.Xt ; 62.20.Mk ; 68.47.Jn ; 82.40.Bj ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Electronic transport in interface structures ; Exact sciences and technology ; Materials science ; Physics ; Semiconductor-electrolyte contacts ; Surface treatments</subject><ispartof>Physica status solidi. A, Applications and materials science, 2007-05, Vol.204 (5), p.1245-1249</ispartof><rights>Copyright © 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2007 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3</citedby><cites>FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18791886$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Grzanna, J.</creatorcontrib><creatorcontrib>Jungblut, H.</creatorcontrib><creatorcontrib>Lewerenz, H. J.</creatorcontrib><title>Nano- and macropores in the model for current oscillations at the Si/electrolyte contact</title><title>Physica status solidi. A, Applications and materials science</title><addtitle>phys. stat. sol. (a)</addtitle><description>The transition from sustained to damped current oscillations or to stationary behavior is described using a model based on morphological aspects. A roughening of the oxide and of the underlying Si surface is predicted, in accordance with measurements. The role of cracks and nanopores in silicon oxide is discussed with regard to roughness increase and macropore formation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><subject>05.45.Xt</subject><subject>62.20.Mk</subject><subject>68.47.Jn</subject><subject>82.40.Bj</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Electronic transport in interface structures</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Physics</subject><subject>Semiconductor-electrolyte contacts</subject><subject>Surface treatments</subject><issn>1862-6300</issn><issn>0031-8965</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNqFkElPwzAQhS0EElC4cvYFbileUsc5IpaCQCwqCG7WxJkIQxoX2xX03xMoKtw4zYz0vjczj5A9zoacMXE4ixGGgjFV5JLxNbLFtRKZkrxcX_WMbZLtGF8Yy0d5wbfI0zV0PqPQ1XQKNviZDxip62h6Rjr1Nba08YHaeQjYJeqjdW0LyfkuUkjfqok7xBZtCr5dJKTWdwls2iEbDbQRd3_qgDycnd4fn2dXN-OL46OrzEqteaaxxFzKClRV2YLLRvOG2VqXAioQNVplqxzzEbeiFpVmRSNlIUVjR1LVWoEckIOl7yz4tznGZKYuWuyP7NDPoxFlyRTvVwzIcCnsv4wxYGNmwU0hLAxn5itA8xWgWQXYA_s_zhAttE2Azrr4S-mi5FqrXlcude-uxcU_ruZ2Mjn6uyNbsi4m_FixEF6NKmQxMo_XY_N4eaLv1Lgf5CfSvJJD</recordid><startdate>200705</startdate><enddate>200705</enddate><creator>Grzanna, J.</creator><creator>Jungblut, H.</creator><creator>Lewerenz, H. J.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>200705</creationdate><title>Nano- and macropores in the model for current oscillations at the Si/electrolyte contact</title><author>Grzanna, J. ; Jungblut, H. ; Lewerenz, H. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>05.45.Xt</topic><topic>62.20.Mk</topic><topic>68.47.Jn</topic><topic>82.40.Bj</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Electronic transport in interface structures</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Physics</topic><topic>Semiconductor-electrolyte contacts</topic><topic>Surface treatments</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Grzanna, J.</creatorcontrib><creatorcontrib>Jungblut, H.</creatorcontrib><creatorcontrib>Lewerenz, H. J.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Grzanna, J.</au><au>Jungblut, H.</au><au>Lewerenz, H. J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nano- and macropores in the model for current oscillations at the Si/electrolyte contact</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><addtitle>phys. stat. sol. (a)</addtitle><date>2007-05</date><risdate>2007</risdate><volume>204</volume><issue>5</issue><spage>1245</spage><epage>1249</epage><pages>1245-1249</pages><issn>1862-6300</issn><issn>0031-8965</issn><eissn>1862-6319</eissn><abstract>The transition from sustained to damped current oscillations or to stationary behavior is described using a model based on morphological aspects. A roughening of the oxide and of the underlying Si surface is predicted, in accordance with measurements. The role of cracks and nanopores in silicon oxide is discussed with regard to roughness increase and macropore formation. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssa.200674301</doi><tpages>5</tpages></addata></record> |
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| identifier | ISSN: 1862-6300 |
| ispartof | Physica status solidi. A, Applications and materials science, 2007-05, Vol.204 (5), p.1245-1249 |
| issn | 1862-6300 0031-8965 1862-6319 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_29906143 |
| source | Wiley-Blackwell Read & Publish Collection |
| subjects | 05.45.Xt 62.20.Mk 68.47.Jn 82.40.Bj Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Electronic transport in interface structures Exact sciences and technology Materials science Physics Semiconductor-electrolyte contacts Surface treatments |
| title | Nano- and macropores in the model for current oscillations at the Si/electrolyte contact |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T00%3A35%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nano-%20and%20macropores%20in%20the%20model%20for%20current%20oscillations%20at%20the%20Si/electrolyte%20contact&rft.jtitle=Physica%20status%20solidi.%20A,%20Applications%20and%20materials%20science&rft.au=Grzanna,%20J.&rft.date=2007-05&rft.volume=204&rft.issue=5&rft.spage=1245&rft.epage=1249&rft.pages=1245-1249&rft.issn=1862-6300&rft.eissn=1862-6319&rft_id=info:doi/10.1002/pssa.200674301&rft_dat=%3Cproquest_cross%3E29906143%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c3881-8e9e433ba6bbc713f81f0cd892aba2dec6cb4e451c2d2b807f33732fc536d86a3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=29906143&rft_id=info:pmid/&rfr_iscdi=true |