Structures of Co and Pt nanoclusters on a thin film of Al2O3/NiAl(100) from reflection high-energy electron diffraction and scanning-tunnelling microscopy

With reflection high-energy electron diffraction (RHEED) and scanning tunnelling microscopy (STM), we made measurements on Co and Pt nanoclusters grown by vapour deposition on a thin film of Al2O3/NiAl(100).

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Bibliographic Details
Published in:Surface science 2007-05, Vol.601 (10), p.2139-2146
Main Authors: LUO, M. F, WEN, W. H, LIN, C. S, CHIANG, C. I, SARTALE, S. D, ZEI, M. S
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Exact sciences and technology
Physics
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Description
Summary:With reflection high-energy electron diffraction (RHEED) and scanning tunnelling microscopy (STM), we made measurements on Co and Pt nanoclusters grown by vapour deposition on a thin film of Al2O3/NiAl(100).
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2007.03.016