Structural and Thermal Diffusivity Studies of Polycrystalline (CuSe)1-XSeX Metal Chalcogenide Compound

• Published in: Solid State Science and Technology (AIP Conference Proceedings Volume 909) 2007-01, Vol.909, p.243-247
• Main Authors: Josephine, L Y C, Talib, Z A, Yunus, W M M, Zainal, Z, Moksin, M M, Lim, K P, Yusoff, W D W
• Format: Article
• Language: English
• ISSN: 0094-243X
• DOI: 10.1063/1.2739859

This paper reports the preparation and the characterization of the (CuSe)1-xSex metal chalcogenide semiconductor compounds with different stoichiometric compositions of Se (x = 0, 0.2, 0.4, 0.5, 0.6, 0.8, 1.0) in bulk form. The (CuSe)1-xSex compounds were prepared using the solid state reaction by varying the ratio of CuSe:Se in the reaction mixture. X-ray powder diffraction analysis is used to identify and measure the mass absorption coefficient of the (CuSe)1-xSex compounds to support the thermal diffusivity behaviour. The thermal diffusivity of the polycrystalline (CuSe)1-xSex compounds were measured and analyzed for the first time, using the photoflash technique. The thermal diffusivity values were determined to be in the range of 2.524 X 10-3 cm2/s to 1.125 X 10-2 cm2/s. It was found that the thermal diffusivity value tends to decrease as the parameter x increases. The relationship between the thermal diffusivity, mass absorption coefficient and density of the (CuSe)1-xSex are discussed in detail.