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XPS Studies on Composite ZrO2-CeO2 Thin Films Deposited on Metal Substrate by Sol-Gel
The influence of heat-treated temperature and the CeO2 content on the chemical composition and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in t...
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| Published in: | Key engineering materials 2007-01, Vol.336-338, p.2652-2654 |
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| Main Authors: | , , , , , , , , |
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| Language: | English |
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| container_end_page | 2654 |
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| container_start_page | 2652 |
| container_title | Key engineering materials |
| container_volume | 336-338 |
| creator | Ma, Hong Wen Wang, Li Zhao, Hui Feng Luo, Wu Wen Yu, Xin Gang Bi, Wen Yue Zuo, Yan Bin Liu, Lan Yun Gong, Yi |
| description | The influence of heat-treated temperature and the CeO2 content on the chemical composition
and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has
been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in
the form of their respective stable state, such as Fe2O3, (Fe0.6Cr0.4)O3, ZrO2, CeO2, when heat treated at
600°C and 700°C for 2h respectively; with the increase of heat-treated temperature, the area of oxygen
with O1s peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with
O1s peak corresponding to value of bonding energy 531.7ev decreases. |
| doi_str_mv | 10.4028/www.scientific.net/KEM.336-338.2652 |
| format | article |
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and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has
been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in
the form of their respective stable state, such as Fe2O3, (Fe0.6Cr0.4)O3, ZrO2, CeO2, when heat treated at
600°C and 700°C for 2h respectively; with the increase of heat-treated temperature, the area of oxygen
with O1s peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with
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and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has
been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in
the form of their respective stable state, such as Fe2O3, (Fe0.6Cr0.4)O3, ZrO2, CeO2, when heat treated at
600°C and 700°C for 2h respectively; with the increase of heat-treated temperature, the area of oxygen
with O1s peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with
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and the valence state of elements on surface of ZrO2-CeO2 thin films deposited on metal substrates has
been studied by X-ray photoelectron spectroscopy. Results show that: elements of Fe, Cr, Zr, Ce exist in
the form of their respective stable state, such as Fe2O3, (Fe0.6Cr0.4)O3, ZrO2, CeO2, when heat treated at
600°C and 700°C for 2h respectively; with the increase of heat-treated temperature, the area of oxygen
with O1s peak corresponding to value of bonding energy 529.28ev increases, but the area of oxygen with
O1s peak corresponding to value of bonding energy 531.7ev decreases.</abstract><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/KEM.336-338.2652</doi><tpages>3</tpages></addata></record> |
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| title | XPS Studies on Composite ZrO2-CeO2 Thin Films Deposited on Metal Substrate by Sol-Gel |
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