Loading…

Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K

The temperature dependence of electrical resistivitiy of Zr55Cu30-XAl10Ni5NbX (numbers indicate at.% X=0, 1, 3 and 5) bulk metallic glasses was investigated below 300K. For the Zr55Cu(30-X)Al10Ni5NbX alloys with X=1, 3 and 5 consisting of nanocrystals dispersed in the amorphous matrix, the electrica...

Full description

Saved in:
Bibliographic Details
Published in:Materials science & engineering. A, Structural materials : properties, microstructure and processing Structural materials : properties, microstructure and processing, 2007-03, Vol.449-451, p.548-551
Main Authors: Okai, D., Nanbu, A., Fukami, T., Yamasaki, T., Zhang, T., Yokoyama, Y., Motoyama, G., Oda, Y., Kimura, H.M., Inoue, A.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73
cites cdi_FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73
container_end_page 551
container_issue
container_start_page 548
container_title Materials science & engineering. A, Structural materials : properties, microstructure and processing
container_volume 449-451
creator Okai, D.
Nanbu, A.
Fukami, T.
Yamasaki, T.
Zhang, T.
Yokoyama, Y.
Motoyama, G.
Oda, Y.
Kimura, H.M.
Inoue, A.
description The temperature dependence of electrical resistivitiy of Zr55Cu30-XAl10Ni5NbX (numbers indicate at.% X=0, 1, 3 and 5) bulk metallic glasses was investigated below 300K. For the Zr55Cu(30-X)Al10Ni5NbX alloys with X=1, 3 and 5 consisting of nanocrystals dispersed in the amorphous matrix, the electrical resistivities decreased abruptly below approximately 2.3-2.9K. For the amorphous Zr55Cu30Al10Ni5 alloy, the electrical resistivitiy increased with decreasing temperature from 300K up to approximately 2.0K. The significant decrease of electrical resistivities of nanocrystal-dispersed amorphous alloys was attributable to the zero-resistivity effect of superconducting phases contained in the alloys. The Nb addition to Zr55Cu30Al10Ni5 metallic glass was found to precipitate superconducting phases within the amorphous matrix.
doi_str_mv 10.1016/j.msea.2006.02.446
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_29980614</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>29980614</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73</originalsourceid><addsrcrecordid>eNotkLtOwzAUhj2ARCm8AJMntobjS25jVXETFSxlYbEc5xi5dZpgJ6BuvANvyJOQqCzfP5xfv3Q-Qq4YJAxYdrNNmog64QBZAjyRMjshMyg5W6RQijNyHuMWAJiEdEZ2G2w6DLofAtIaO9zXuDdIW0vRo-mDM9rTgNHF3n26_jBd3sLv989qGLH0I57dhIpWg9_RBnvtvTP03esYMdIKfftFBcDTBTm12ke8_M85eb273aweFuuX-8fVcr0wjAu5YIXIC4EgeGW1EFZaVgkLaY6mBm3TvMyNhvEViTqXBaYWMWN1VhteFnWdizm5Pu52of0YMPaqcdGg93qP7RAVL8sCMibHIj8WTWhjDGhVF1yjw0ExUJNLtVWTSzW5VMDV6FL8AUa7b6Y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>29980614</pqid></control><display><type>article</type><title>Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K</title><source>ScienceDirect Freedom Collection 2022-2024</source><creator>Okai, D. ; Nanbu, A. ; Fukami, T. ; Yamasaki, T. ; Zhang, T. ; Yokoyama, Y. ; Motoyama, G. ; Oda, Y. ; Kimura, H.M. ; Inoue, A.</creator><creatorcontrib>Okai, D. ; Nanbu, A. ; Fukami, T. ; Yamasaki, T. ; Zhang, T. ; Yokoyama, Y. ; Motoyama, G. ; Oda, Y. ; Kimura, H.M. ; Inoue, A.</creatorcontrib><description>The temperature dependence of electrical resistivitiy of Zr55Cu30-XAl10Ni5NbX (numbers indicate at.% X=0, 1, 3 and 5) bulk metallic glasses was investigated below 300K. For the Zr55Cu(30-X)Al10Ni5NbX alloys with X=1, 3 and 5 consisting of nanocrystals dispersed in the amorphous matrix, the electrical resistivities decreased abruptly below approximately 2.3-2.9K. For the amorphous Zr55Cu30Al10Ni5 alloy, the electrical resistivitiy increased with decreasing temperature from 300K up to approximately 2.0K. The significant decrease of electrical resistivities of nanocrystal-dispersed amorphous alloys was attributable to the zero-resistivity effect of superconducting phases contained in the alloys. The Nb addition to Zr55Cu30Al10Ni5 metallic glass was found to precipitate superconducting phases within the amorphous matrix.</description><identifier>ISSN: 0921-5093</identifier><identifier>DOI: 10.1016/j.msea.2006.02.446</identifier><language>eng</language><ispartof>Materials science &amp; engineering. A, Structural materials : properties, microstructure and processing, 2007-03, Vol.449-451, p.548-551</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73</citedby><cites>FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Okai, D.</creatorcontrib><creatorcontrib>Nanbu, A.</creatorcontrib><creatorcontrib>Fukami, T.</creatorcontrib><creatorcontrib>Yamasaki, T.</creatorcontrib><creatorcontrib>Zhang, T.</creatorcontrib><creatorcontrib>Yokoyama, Y.</creatorcontrib><creatorcontrib>Motoyama, G.</creatorcontrib><creatorcontrib>Oda, Y.</creatorcontrib><creatorcontrib>Kimura, H.M.</creatorcontrib><creatorcontrib>Inoue, A.</creatorcontrib><title>Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K</title><title>Materials science &amp; engineering. A, Structural materials : properties, microstructure and processing</title><description>The temperature dependence of electrical resistivitiy of Zr55Cu30-XAl10Ni5NbX (numbers indicate at.% X=0, 1, 3 and 5) bulk metallic glasses was investigated below 300K. For the Zr55Cu(30-X)Al10Ni5NbX alloys with X=1, 3 and 5 consisting of nanocrystals dispersed in the amorphous matrix, the electrical resistivities decreased abruptly below approximately 2.3-2.9K. For the amorphous Zr55Cu30Al10Ni5 alloy, the electrical resistivitiy increased with decreasing temperature from 300K up to approximately 2.0K. The significant decrease of electrical resistivities of nanocrystal-dispersed amorphous alloys was attributable to the zero-resistivity effect of superconducting phases contained in the alloys. The Nb addition to Zr55Cu30Al10Ni5 metallic glass was found to precipitate superconducting phases within the amorphous matrix.</description><issn>0921-5093</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNotkLtOwzAUhj2ARCm8AJMntobjS25jVXETFSxlYbEc5xi5dZpgJ6BuvANvyJOQqCzfP5xfv3Q-Qq4YJAxYdrNNmog64QBZAjyRMjshMyg5W6RQijNyHuMWAJiEdEZ2G2w6DLofAtIaO9zXuDdIW0vRo-mDM9rTgNHF3n26_jBd3sLv989qGLH0I57dhIpWg9_RBnvtvTP03esYMdIKfftFBcDTBTm12ke8_M85eb273aweFuuX-8fVcr0wjAu5YIXIC4EgeGW1EFZaVgkLaY6mBm3TvMyNhvEViTqXBaYWMWN1VhteFnWdizm5Pu52of0YMPaqcdGg93qP7RAVL8sCMibHIj8WTWhjDGhVF1yjw0ExUJNLtVWTSzW5VMDV6FL8AUa7b6Y</recordid><startdate>200703</startdate><enddate>200703</enddate><creator>Okai, D.</creator><creator>Nanbu, A.</creator><creator>Fukami, T.</creator><creator>Yamasaki, T.</creator><creator>Zhang, T.</creator><creator>Yokoyama, Y.</creator><creator>Motoyama, G.</creator><creator>Oda, Y.</creator><creator>Kimura, H.M.</creator><creator>Inoue, A.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>200703</creationdate><title>Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K</title><author>Okai, D. ; Nanbu, A. ; Fukami, T. ; Yamasaki, T. ; Zhang, T. ; Yokoyama, Y. ; Motoyama, G. ; Oda, Y. ; Kimura, H.M. ; Inoue, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Okai, D.</creatorcontrib><creatorcontrib>Nanbu, A.</creatorcontrib><creatorcontrib>Fukami, T.</creatorcontrib><creatorcontrib>Yamasaki, T.</creatorcontrib><creatorcontrib>Zhang, T.</creatorcontrib><creatorcontrib>Yokoyama, Y.</creatorcontrib><creatorcontrib>Motoyama, G.</creatorcontrib><creatorcontrib>Oda, Y.</creatorcontrib><creatorcontrib>Kimura, H.M.</creatorcontrib><creatorcontrib>Inoue, A.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Materials science &amp; engineering. A, Structural materials : properties, microstructure and processing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Okai, D.</au><au>Nanbu, A.</au><au>Fukami, T.</au><au>Yamasaki, T.</au><au>Zhang, T.</au><au>Yokoyama, Y.</au><au>Motoyama, G.</au><au>Oda, Y.</au><au>Kimura, H.M.</au><au>Inoue, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K</atitle><jtitle>Materials science &amp; engineering. A, Structural materials : properties, microstructure and processing</jtitle><date>2007-03</date><risdate>2007</risdate><volume>449-451</volume><spage>548</spage><epage>551</epage><pages>548-551</pages><issn>0921-5093</issn><abstract>The temperature dependence of electrical resistivitiy of Zr55Cu30-XAl10Ni5NbX (numbers indicate at.% X=0, 1, 3 and 5) bulk metallic glasses was investigated below 300K. For the Zr55Cu(30-X)Al10Ni5NbX alloys with X=1, 3 and 5 consisting of nanocrystals dispersed in the amorphous matrix, the electrical resistivities decreased abruptly below approximately 2.3-2.9K. For the amorphous Zr55Cu30Al10Ni5 alloy, the electrical resistivitiy increased with decreasing temperature from 300K up to approximately 2.0K. The significant decrease of electrical resistivities of nanocrystal-dispersed amorphous alloys was attributable to the zero-resistivity effect of superconducting phases contained in the alloys. The Nb addition to Zr55Cu30Al10Ni5 metallic glass was found to precipitate superconducting phases within the amorphous matrix.</abstract><doi>10.1016/j.msea.2006.02.446</doi><tpages>4</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0921-5093
ispartof Materials science & engineering. A, Structural materials : properties, microstructure and processing, 2007-03, Vol.449-451, p.548-551
issn 0921-5093
language eng
recordid cdi_proquest_miscellaneous_29980614
source ScienceDirect Freedom Collection 2022-2024
title Temperature dependence of electrical resistivity of Zr–Cu–Al–Ni–Nb bulk metallic glasses below 300K
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T09%3A29%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Temperature%20dependence%20of%20electrical%20resistivity%20of%20Zr%E2%80%93Cu%E2%80%93Al%E2%80%93Ni%E2%80%93Nb%20bulk%20metallic%20glasses%20below%20300K&rft.jtitle=Materials%20science%20&%20engineering.%20A,%20Structural%20materials%20:%20properties,%20microstructure%20and%20processing&rft.au=Okai,%20D.&rft.date=2007-03&rft.volume=449-451&rft.spage=548&rft.epage=551&rft.pages=548-551&rft.issn=0921-5093&rft_id=info:doi/10.1016/j.msea.2006.02.446&rft_dat=%3Cproquest_cross%3E29980614%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c1234-183783e032bfa33f4f1b3f057ecd0af5797ca00934ea748e5fee61d6dc298dd73%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=29980614&rft_id=info:pmid/&rfr_iscdi=true