Effect of CeO2 buffer layer thickness on the structures and properties of YBCO coated conductors

• Published in: Applied surface science 2007-06, Vol.253 (17), p.7172-7177
• Main Authors: MEIYA LI, XINGZHONG ZHAO, MA, B, DORRIS, S. E, BALACHANDRAN, U, MARONI, V. A
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2007.02.186

Biaxially textured YBa2Cu307_, (YBCO) films were grown on inclined-substrate-deposited (ISD) MgO-textured metal substrates by pulsed laser deposition. CeO2 was deposited as a buffer layer prior to YBCO growth. CeO2 layers of different thickness were prepared to evaluate the thickness dependence of the YBCO films. The biaxial alignment features of the films were examined by X-ray diffraction 20-scans, pole-figure, 4)-scans and rocking curves of f2 angles. The significant influence of the CeO2 thickness on the structure and properties of the YBCO films were demonstrated and the optimal thickness was found to be about 10 nm. High values of TT = 91 K and ,/c = 5.5 x 105 A/cm2 were obtained on YBCO films with optimal Ce02 thickness at 77 K in zero field. The possible mechanisms responsible for the dependence of the structure and the properties of the YBCO films on the thickness of the CeO2 buffer layers are discussed.