Modeling absorption of rough interface between dielectric and conductive medium

The effects of a random rough surface between dielectric and lossy conductive medium on power absorption are analyzed by considering incident plane waves impinging on the interface. We use two methods to formulate and solve the 2‐D problem: the two‐media small perturbation method to second order (SP...

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Bibliographic Details
Published in:Microwave and optical technology letters 2007-01, Vol.49 (1), p.7-13
Main Authors: Gu, Xiaoxiong, Tsang, Leung, Braunisch, Henning, Xu, Peng
Format: Article
Language:English
Subjects:
conductors
perturbation methods
rough surfaces
T-matrix method
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Summary:The effects of a random rough surface between dielectric and lossy conductive medium on power absorption are analyzed by considering incident plane waves impinging on the interface. We use two methods to formulate and solve the 2‐D problem: the two‐media small perturbation method to second order (SPM2) and the numerical system transfer operator matrix method, referred to as T‐matrix method. The two methods are in agreement within the regimes of validity. The results show significant difference between absorption of a rough surface and that of a smooth surface. Surface fields are further examined numerically. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 7–13, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22023
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.22023