Interface properties and electronic structure of ultrathin manganese oxide films on Ag(0 0 1)

Ultrathin manganese monoxide films on silver single crystal substrates are studied as a function of the thickness using X-ray absorption spectroscopy (XAS) and X-ray photoemission spectroscopy (XPS). It was found that electronic and geometric properties in ultrathin films differ from the bulk. A tet...

Full description

Saved in:
Bibliographic Details
Published in:Surface science 2007-09, Vol.601 (18), p.4484-4487
Main Authors: Nagel, M., Biswas, I., Peisert, H., Chassé, T.
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Epitaxial growth
Exact sciences and technology
Low energy electron diffraction
Metal oxide interface
Near edge extended X-ray absorption fine structure
Physics
Soft X-ray photoelectron spectroscopy
Transition metal oxide
Ultrathin film
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Ultrathin manganese monoxide films on silver single crystal substrates are studied as a function of the thickness using X-ray absorption spectroscopy (XAS) and X-ray photoemission spectroscopy (XPS). It was found that electronic and geometric properties in ultrathin films differ from the bulk. A tetragonal distortion of the oxide films is revealed by polarisation-dependent X-ray absorption measurements: the extent decreases with increasing film thickness. A structural relaxation of epitaxial oxide layers induced by heating also leads to a decrease of the tetragonal interface strain. The electronic structure of ultrathin manganese oxide films in the valence band region is very similar to that in the bulk oxide.
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2007.04.137