Loading…

Computing with a trillion crummy components

Attempting to build nanometer-scale circuits that are both defect- and fault-tolerant.

Saved in:
Bibliographic Details
Published in:Communications of the ACM 2007-09, Vol.50 (9), p.35-39
Main Authors: Robinett, Warren, Snider, Gregory S., Kuekes, Philip J., Williams, R. Stanley
Format: Magazinearticle
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Attempting to build nanometer-scale circuits that are both defect- and fault-tolerant.
ISSN:0001-0782
1557-7317
DOI:10.1145/1284621.1284644