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Coexisting electron emission mechanisms in small metal particles observed in fs-laser excited PEEM

Silver cluster films deposited on Si(1 1 1) were investigated by spectroscopic photoelectron microscopy using fs-laser excitation tuneable between hν = 1.45–1.65 eV and 2.9–3.3 eV. With increasing coverage the films grown as stepped wedges first exhibit clusters of few nanometers diameter with narro...

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Bibliographic Details
Published in:Surface science 2007-10, Vol.601 (20), p.4706-4713
Main Authors: Gloskovskii, A., Valdaitsev, D., Nepijko, S.A., Schönhense, G., Rethfeld, B.
Format: Article
Language:English
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Summary:Silver cluster films deposited on Si(1 1 1) were investigated by spectroscopic photoelectron microscopy using fs-laser excitation tuneable between hν = 1.45–1.65 eV and 2.9–3.3 eV. With increasing coverage the films grown as stepped wedges first exhibit clusters of few nanometers diameter with narrow size distributions that later agglomerate forming larger islands up to about 100 nm diameter. The cluster films have been characterized by SEM, AFM and HR-TEM. In the 3.1 eV range the small clusters emit more effectively and the dependence of electron yield on laser power follows a quadratic power law. Microspectroscopy reveals that the Fermi level onset is sharp(
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2007.05.046