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Coexisting electron emission mechanisms in small metal particles observed in fs-laser excited PEEM
Silver cluster films deposited on Si(1 1 1) were investigated by spectroscopic photoelectron microscopy using fs-laser excitation tuneable between hν = 1.45–1.65 eV and 2.9–3.3 eV. With increasing coverage the films grown as stepped wedges first exhibit clusters of few nanometers diameter with narro...
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Published in: | Surface science 2007-10, Vol.601 (20), p.4706-4713 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Silver cluster films deposited on Si(1
1
1) were investigated by spectroscopic photoelectron microscopy using fs-laser excitation tuneable between
hν
=
1.45–1.65
eV and 2.9–3.3
eV. With increasing coverage the films grown as stepped wedges first exhibit clusters of few nanometers diameter with narrow size distributions that later agglomerate forming larger islands up to about 100
nm diameter. The cluster films have been characterized by SEM, AFM and HR-TEM. In the 3.1
eV range the small clusters emit more effectively and the dependence of electron yield on laser power follows a quadratic power law. Microspectroscopy reveals that the Fermi level onset is sharp( |
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ISSN: | 0039-6028 1879-2758 |
DOI: | 10.1016/j.susc.2007.05.046 |