Roughness in manganite-based superlattices

In this work we present a structural analysis of La 0.75Sr 0.25MnO 3/LaNiO 3 (LSMO/LNO) superlattices, performed by X-ray diffraction spectroscopy and X-ray reflectivity. The samples were deposited by dc magnetron sputtering on single-crystalline (0 0 1) oriented SrTiO 3. The strain relaxation and t...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 2007-10, Vol.254 (1), p.219-221
Main Authors: Rojas Sánchez, J.C., Granada, M., Steren, L.B., Mazzaro, I., Mosca, D.H.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Crystalline structure
Deposition by sputtering
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Materials science
Methods of deposition of films and coatings
film growth and epitaxy
Perovskite multilayers
Physics
Single-crystal and powder diffraction
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
X-ray diffraction and scattering
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this work we present a structural analysis of La 0.75Sr 0.25MnO 3/LaNiO 3 (LSMO/LNO) superlattices, performed by X-ray diffraction spectroscopy and X-ray reflectivity. The samples were deposited by dc magnetron sputtering on single-crystalline (0 0 1) oriented SrTiO 3. The strain relaxation and the roughness at the interfaces were estimated from the analysis of the X-ray patterns. The thickness of LSMO reference layers has been measured by means of low-angle X-ray reflectivity, finding a very good agreement with the nominal values.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2007.07.036