A compact ion source combining electron-impact and thermal ionization for multiple-reflection time-of-flight mass spectrometry

• Published in: Review of scientific instruments 2024-08, Vol.95 (8)
• Main Authors: Yu, Jiajun, Mollaebrahimi, Ali, San Andrés, Samuel Ayet, Dickel, Timo, Plaß, Wolfgang R., Wilsenach, Heinrich, Beck, Sönke, Ge, Zhuang, Geissel, Hans, Hornung, Christine, Jacobs, Andrew, Kripko-Koncz, Gabriella, Kwiatkowski, Anna A., Narang, Meetika, Scheidenberger, Christoph, Sequeira, Jaden, Walls, Coulter
• Format: Article
• Language: English
• Subjects: Atomic properties; Electron impact; Heavy ions; Ion sources; Ionization potentials; Mass spectrometry; Sulfur hexafluoride
• ISSN: 0034-6748; 1089-7623; 1089-7623
• DOI: 10.1063/5.0213443

A compact ion source combining electron impact and thermal ionization has been developed and commissioned in two Multiple-Reflection Time-Of-Flight Mass Spectrometer (MR-TOF-MS) setups at the Fragment Separator Ion Catcher at the GSI Helmholtz Centre for Heavy Ion Research, Darmstadt, Germany, and at TRIUMF’s Ion Trap for Atomic and Nuclear science at TRIUMF Canada’s particle accelerator center, Vancouver, Canada. The ion source is notable for its compact dimensions of 50 mm in height and 68 mm in diameter. The ion source is currently in daily operation at both facilities. Design, simulations, and results of combining ions from thermal and electron-impact ionization of different gases (perfluoropropane and sulfur hexafluoride) are presented in this work. The systematic effects of heating power on the thermal source were studied in detail. The source has demonstrated stable and long-term production of reference ions over a wide mass range for the MR-TOF-MS. This versatile ion source has also been used to optimize and investigate the transport of ions with different chemical reactivity and ionization potentials.