Quantum Metrology Enhanced by Leveraging Informative Noise with Error Correction

The primary challenge in advancing practical quantum technology is the presence of noise, which can lead to decoherence and undermine the advantages of quantum systems. However, it is worth noting that noise can also contain information that can be harnessed to improve performance in certain quantum...

Full description

Saved in:
Bibliographic Details
Published in:Physical review letters 2024-11, Vol.133 (19), p.190801, Article 190801
Main Authors: Chen, Hongzhen, Chen, Yu, Liu, Jing, Miao, Zibo, Yuan, Haidong
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The primary challenge in advancing practical quantum technology is the presence of noise, which can lead to decoherence and undermine the advantages of quantum systems. However, it is worth noting that noise can also contain information that can be harnessed to improve performance in certain quantum information tasks. This has been explored for specific types of noise, but the full potential of informative noise within general dynamics remains largely unknown. Here we demonstrate that informative noise can be transformed into a valuable resource for enhancing precision limits in quantum metrology. We provide necessary and sufficient conditions under which the precision achieved in the presence of informative noise can attain Heisenberg scaling. Our research offers a fresh perspective on the role of noise in quantum metrology and opens up avenues for achieving higher precision beyond the previously anticipated ultimate limit.
ISSN:0031-9007
1079-7114
1079-7114
DOI:10.1103/PhysRevLett.133.190801