Optical and structural properties of ZnO + Zn2TiO4 thin films prepared by the sol-gel method

Issue Title: Special Issue: Photovoltaics, Solar Energy Materials & Thin Films - IMRC 2006, Cancun, Mexico Guest Editor Xavier Mathew ZnO + Zn^sub 2^TiO^sub 4^ thin films were obtained by the sol-gel method using precursor solutions with different Ti/Zn ratios in the 0.18-2.13 range. The films w...

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Published in:Journal of materials science. Materials in electronics 2007-11, Vol.18 (11), p.1127-1130
Main Authors: MAYEN-HERNANDEZ, Sandra A, TORRES-DELGADO, Gerardo, CASTANEDO-PEREZ, Rebeca, GUTIERREZ VILLARREAL, Mario, CRUZ-OREA, Alfredo, MENDOZA ALVAREZ, Julio G, ZELAYA-ANGEL, Orlando
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Exact sciences and technology
Glass substrates
Materials
Ratios
Spectrum analysis
Thin films
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Summary:Issue Title: Special Issue: Photovoltaics, Solar Energy Materials & Thin Films - IMRC 2006, Cancun, Mexico Guest Editor Xavier Mathew ZnO + Zn^sub 2^TiO^sub 4^ thin films were obtained by the sol-gel method using precursor solutions with different Ti/Zn ratios in the 0.18-2.13 range. The films were deposited on glass substrates and annealed in an open atmosphere at 550 °C. The oxide was characterized by X-ray diffraction and photoacoustic (PA) spectroscopy. The films were constituted of polycrystalline ZnO for the lowest Ti/Zn ratio (0.18), polycrystalline Zn^sub 2^TiO^sub 4^ for the 0.70 and 1.0 ratios, and mixes of both oxides for the intermediate ratios (0.32 and 0.50). For the highest ratios studied (1.44 and 2.13), the films were amorphous. The energy band gap (E^sub g^) values were determined from optical absorption spectra, measured by means of the PA technique spectra. E^sub g^ varied in the 3.15 eV (ZnO) to 3.70 eV (Zn^sub 2^TiO^sub 4^) range.[PUBLICATION ABSTRACT]
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-007-9267-8