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Unveiling the role of the ERD15 gene in wheat's tolerance to combined drought and salinity stress: a meta‐analysis of QTL and RNA‐Seq data

The coexistence of drought and salinity stresses in field conditions significantly hinders wheat (Triticum aestivum L.) productivity. Understanding the molecular mechanisms governing response and tolerance to these stresses is crucial for developing resilient wheat varieties. Our research, employing...

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Bibliographic Details
Published in:Physiologia plantarum 2024-09, Vol.176 (5), p.e14570-n/a
Main Authors: Shamloo‐Dashtpagerdi, Roohollah, Tanin, Mohammad Jafar, Aliakbari, Massume, Saini, Dinesh Kumar
Format: Article
Language:English
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Summary:The coexistence of drought and salinity stresses in field conditions significantly hinders wheat (Triticum aestivum L.) productivity. Understanding the molecular mechanisms governing response and tolerance to these stresses is crucial for developing resilient wheat varieties. Our research, employing a combination of meta‐QTL and meta‐RNA‐Seq transcriptome analyses, has uncovered the genome functional landscape of wheat in response to drought and salinity. We identified 118 meta‐QTLs (MQTLs) distributed across all 21 wheat chromosomes, with ten designated as the most promising. Additionally, we found 690 meta‐differentially expressed genes (mDEGs) shared between drought and salinity stress. Notably, our findings highlight the Early Responsive to Dehydration 15 (ERD15) gene, located in one of the most promising MQTLs, as a key gene in the shared gene network of drought and salinity stress. ERD15, differentially expressed between contrasting wheat genotypes under combined stress conditions, significantly regulates water relations, photosynthetic activity, antioxidant activity, and ion homeostasis. These findings not only provide valuable insights into the molecular genetic mechanisms underlying combined stress tolerance in wheat but also hold the potential to contribute significantly to the development of stress‐resilient wheat varieties.
ISSN:0031-9317
1399-3054
1399-3054
DOI:10.1111/ppl.14570