A statistical evaluation of the field emission for copper oxide nanostructures

A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical m...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 2008-01, Vol.254 (6), p.1859-1869
Main Authors: da Rocha, M.S.F., Santos, T.E.A., de Paulo, A.C., Hering, V.R., Engelsen, Daniel den, Vuolo, J.H., Mammana, S.S., Mammana, V.P.
Format: Article
Language:English
Subjects:
Computational analysis
Copper oxide nanostructures
Field emission
Fowler–Nordheim
Seppen–Katamuki
Statistical method
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical models were derived to describe the effect of small electric field perturbations in the Fowler–Nordheim (F–N) equation, and then to explain the trend of the data represented in the SK charts. The field enhancement factor and the emission area parameters showed to be very sensitive to variations in the electric field for most of the samples. We have found that the anode–cathode distance is critical in the field emission characterization of samples having a non-rigid nanostructure.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2007.07.172