A statistical evaluation of the field emission for copper oxide nanostructures

A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical m...

Full description

Saved in:
Bibliographic Details
Published in:Applied surface science 2008-01, Vol.254 (6), p.1859-1869
Main Authors: da Rocha, M.S.F., Santos, T.E.A., de Paulo, A.C., Hering, V.R., Engelsen, Daniel den, Vuolo, J.H., Mammana, S.S., Mammana, V.P.
Format: Article
Language:English
Subjects:
Computational analysis
Copper oxide nanostructures
Field emission
Fowler–Nordheim
Seppen–Katamuki
Statistical method
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3
cites cdi_FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3
container_end_page 1869
container_issue 6
container_start_page 1859
container_title Applied surface science
container_volume 254
creator da Rocha, M.S.F.
Santos, T.E.A.
de Paulo, A.C.
Hering, V.R.
Engelsen, Daniel den
Vuolo, J.H.
Mammana, S.S.
Mammana, V.P.
description A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical models were derived to describe the effect of small electric field perturbations in the Fowler–Nordheim (F–N) equation, and then to explain the trend of the data represented in the SK charts. The field enhancement factor and the emission area parameters showed to be very sensitive to variations in the electric field for most of the samples. We have found that the anode–cathode distance is critical in the field emission characterization of samples having a non-rigid nanostructure.
doi_str_mv 10.1016/j.apsusc.2007.07.172
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_31907568</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0169433207011129</els_id><sourcerecordid>31907568</sourcerecordid><originalsourceid>FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3</originalsourceid><addsrcrecordid>eNp9UE1LxDAQDaLguvoPPOTkrTUfbdNehGXxCxa96DmkyQSzdJuapKL_3iz1LDwYZua9x8xD6JqSkhLa3O5LNcU56pIRIsoMKtgJWtFW8KKu2-oUrTKtKyrO2Tm6iHFPCGV5u0IvGxyTSi4mp9WA4UsNc279iL3F6QOwdTAYDAcX43FqfcDaTxME7L-dATyq0ccUZp3mAPESnVk1RLj6q2v0_nD_tn0qdq-Pz9vNrtCci1Q0wvTKmtp0nVagmp4oK5hmQtBG8L4XoqG64swQ25G2t0KwirVVz3WrrOo1X6ObxXcK_nOGmGQ-UMMwqBH8HCWnHRF102ZitRB18DEGsHIK7qDCj6REHsOTe7mEJ4_hyYwcXpbdLTLIT3w5CDJqB6MG4wLoJI13_xv8AjlBfDI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>31907568</pqid></control><display><type>article</type><title>A statistical evaluation of the field emission for copper oxide nanostructures</title><source>ScienceDirect Journals</source><creator>da Rocha, M.S.F. ; Santos, T.E.A. ; de Paulo, A.C. ; Hering, V.R. ; Engelsen, Daniel den ; Vuolo, J.H. ; Mammana, S.S. ; Mammana, V.P.</creator><creatorcontrib>da Rocha, M.S.F. ; Santos, T.E.A. ; de Paulo, A.C. ; Hering, V.R. ; Engelsen, Daniel den ; Vuolo, J.H. ; Mammana, S.S. ; Mammana, V.P.</creatorcontrib><description>A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical models were derived to describe the effect of small electric field perturbations in the Fowler–Nordheim (F–N) equation, and then to explain the trend of the data represented in the SK charts. The field enhancement factor and the emission area parameters showed to be very sensitive to variations in the electric field for most of the samples. We have found that the anode–cathode distance is critical in the field emission characterization of samples having a non-rigid nanostructure.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2007.07.172</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Computational analysis ; Copper oxide nanostructures ; Field emission ; Fowler–Nordheim ; Seppen–Katamuki ; Statistical method</subject><ispartof>Applied surface science, 2008-01, Vol.254 (6), p.1859-1869</ispartof><rights>2007 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3</citedby><cites>FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>da Rocha, M.S.F.</creatorcontrib><creatorcontrib>Santos, T.E.A.</creatorcontrib><creatorcontrib>de Paulo, A.C.</creatorcontrib><creatorcontrib>Hering, V.R.</creatorcontrib><creatorcontrib>Engelsen, Daniel den</creatorcontrib><creatorcontrib>Vuolo, J.H.</creatorcontrib><creatorcontrib>Mammana, S.S.</creatorcontrib><creatorcontrib>Mammana, V.P.</creatorcontrib><title>A statistical evaluation of the field emission for copper oxide nanostructures</title><title>Applied surface science</title><description>A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical models were derived to describe the effect of small electric field perturbations in the Fowler–Nordheim (F–N) equation, and then to explain the trend of the data represented in the SK charts. The field enhancement factor and the emission area parameters showed to be very sensitive to variations in the electric field for most of the samples. We have found that the anode–cathode distance is critical in the field emission characterization of samples having a non-rigid nanostructure.</description><subject>Computational analysis</subject><subject>Copper oxide nanostructures</subject><subject>Field emission</subject><subject>Fowler–Nordheim</subject><subject>Seppen–Katamuki</subject><subject>Statistical method</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp9UE1LxDAQDaLguvoPPOTkrTUfbdNehGXxCxa96DmkyQSzdJuapKL_3iz1LDwYZua9x8xD6JqSkhLa3O5LNcU56pIRIsoMKtgJWtFW8KKu2-oUrTKtKyrO2Tm6iHFPCGV5u0IvGxyTSi4mp9WA4UsNc279iL3F6QOwdTAYDAcX43FqfcDaTxME7L-dATyq0ccUZp3mAPESnVk1RLj6q2v0_nD_tn0qdq-Pz9vNrtCci1Q0wvTKmtp0nVagmp4oK5hmQtBG8L4XoqG64swQ25G2t0KwirVVz3WrrOo1X6ObxXcK_nOGmGQ-UMMwqBH8HCWnHRF102ZitRB18DEGsHIK7qDCj6REHsOTe7mEJ4_hyYwcXpbdLTLIT3w5CDJqB6MG4wLoJI13_xv8AjlBfDI</recordid><startdate>20080115</startdate><enddate>20080115</enddate><creator>da Rocha, M.S.F.</creator><creator>Santos, T.E.A.</creator><creator>de Paulo, A.C.</creator><creator>Hering, V.R.</creator><creator>Engelsen, Daniel den</creator><creator>Vuolo, J.H.</creator><creator>Mammana, S.S.</creator><creator>Mammana, V.P.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20080115</creationdate><title>A statistical evaluation of the field emission for copper oxide nanostructures</title><author>da Rocha, M.S.F. ; Santos, T.E.A. ; de Paulo, A.C. ; Hering, V.R. ; Engelsen, Daniel den ; Vuolo, J.H. ; Mammana, S.S. ; Mammana, V.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Computational analysis</topic><topic>Copper oxide nanostructures</topic><topic>Field emission</topic><topic>Fowler–Nordheim</topic><topic>Seppen–Katamuki</topic><topic>Statistical method</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>da Rocha, M.S.F.</creatorcontrib><creatorcontrib>Santos, T.E.A.</creatorcontrib><creatorcontrib>de Paulo, A.C.</creatorcontrib><creatorcontrib>Hering, V.R.</creatorcontrib><creatorcontrib>Engelsen, Daniel den</creatorcontrib><creatorcontrib>Vuolo, J.H.</creatorcontrib><creatorcontrib>Mammana, S.S.</creatorcontrib><creatorcontrib>Mammana, V.P.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>da Rocha, M.S.F.</au><au>Santos, T.E.A.</au><au>de Paulo, A.C.</au><au>Hering, V.R.</au><au>Engelsen, Daniel den</au><au>Vuolo, J.H.</au><au>Mammana, S.S.</au><au>Mammana, V.P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A statistical evaluation of the field emission for copper oxide nanostructures</atitle><jtitle>Applied surface science</jtitle><date>2008-01-15</date><risdate>2008</risdate><volume>254</volume><issue>6</issue><spage>1859</spage><epage>1869</epage><pages>1859-1869</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>A statistical data analysis methodology was developed to evaluate the field emission properties of many samples of copper oxide nanostructured field emitters. This analysis was largely done in terms of Seppen–Katamuki (SK) charts, field strength and emission current. Some physical and mathematical models were derived to describe the effect of small electric field perturbations in the Fowler–Nordheim (F–N) equation, and then to explain the trend of the data represented in the SK charts. The field enhancement factor and the emission area parameters showed to be very sensitive to variations in the electric field for most of the samples. We have found that the anode–cathode distance is critical in the field emission characterization of samples having a non-rigid nanostructure.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2007.07.172</doi><tpages>11</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0169-4332
ispartof Applied surface science, 2008-01, Vol.254 (6), p.1859-1869
issn 0169-4332
1873-5584
language eng
recordid cdi_proquest_miscellaneous_31907568
source ScienceDirect Journals
subjects Computational analysis
Copper oxide nanostructures
Field emission
Fowler–Nordheim
Seppen–Katamuki
Statistical method
title A statistical evaluation of the field emission for copper oxide nanostructures
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T20%3A48%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20statistical%20evaluation%20of%20the%20field%20emission%20for%20copper%20oxide%20nanostructures&rft.jtitle=Applied%20surface%20science&rft.au=da%20Rocha,%20M.S.F.&rft.date=2008-01-15&rft.volume=254&rft.issue=6&rft.spage=1859&rft.epage=1869&rft.pages=1859-1869&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/j.apsusc.2007.07.172&rft_dat=%3Cproquest_cross%3E31907568%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c337t-67dbafd5d99caea6b0af72c2771673bb7761c432d0f908bf7724284b3c8afabc3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=31907568&rft_id=info:pmid/&rfr_iscdi=true