In Situ Transmission Electron Microscopy

The articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the...

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Bibliographic Details
Published in:MRS bulletin 2008-02, Vol.33 (2), p.83-90
Main Authors: Ferreira, P.J., Mitsuishi, K., Stach, E.A.
Format: Article
Language:English
Subjects:
Applied and Technical Physics
Characterization and Evaluation of Materials
Electron, positron and ion microscopes, electron diffractometers and related techniques
Energy Materials
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Materials Engineering
Materials Science
Nanotechnology
Physics
Technical Feature
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Summary:The articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.
ISSN:0883-7694
1938-1425
DOI:10.1557/mrs2008.20