Imaging of ferroelectric vinylidene fluoride and trifluoroethylene copolymer films by scanning tunneling microscopy

• Published in: Applied surface science 2008-02, Vol.254 (8), p.2487-2492
• Main Authors: Zhu, GuoDong, Zeng, ZhiGang, Zhang, Li, Yan, XueJian
• Format: Article
• Language: English
• Subjects: Atomic force microscopy (AFM); Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Current–voltage characteristic; Exact sciences and technology; P(VDF-TrFE); Physics; Scanning tunneling microscopy (STM); Surface morphology
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2007.09.072

In this paper, we reported the possibility to image non-conducting P(VDF-TrFE) copolymer films by STM. The films had the thickness of ∼25.0 nm and were spin-coated onto Au or graphite substrates. For films deposited on Au substrates, STM images showed grain structures of ∼100 nm, much larger than the grains of bare Au substrate. With increased scan rate, the film surface was damaged by STM tip and extreme protrusions and holes were observed. For films deposited on graphite substrates, we only obtained an image of very flat plane and could not observe the topography of the film surface. It seemed that the tip had pierced through the uppermost P(VDF-TrFE) layers and only imaged the layers nearest to the substrate. Asymmetrical current–voltage curves were observed from copolymer films deposited on HOPG. Experimental results were discussed.