Comparison of fractal and profilometric methods for surface topography characterization

In this study microstructural and roughness characterization of surface of aluminium foils used in lithographic printing process was performed by contact and non-contact profilometric methods and fractal analysis. Significant differences in roughness parameters values inferred from stylus method in...

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Bibliographic Details
Published in:Applied surface science 2008-03, Vol.254 (11), p.3449-3458
Main Authors: Mahovic Poljacek, S., Risovic, D., Furic, K., Gojo, M.
Format: Article
Language:English
Subjects:
Aluminium oxide film
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
Disordered solids
Exact sciences and technology
Fractal analysis
Fractals
Interface structure and roughness
Materials science
Metals, semimetals and alloys
Microporous surfaces
Nonlinear dynamics and nonlinear dynamical systems
Physics
Profilometry
Solid surfaces and solid-solid interfaces
Specific materials
Statistical physics, thermodynamics, and nonlinear dynamical systems
Structural modeling: serial-addition models, computer simulation
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:In this study microstructural and roughness characterization of surface of aluminium foils used in lithographic printing process was performed by contact and non-contact profilometric methods and fractal analysis. Significant differences in roughness parameters values inferred from stylus method in respect to those inferred from the non-contact measurements were observed. The investigation of correlation between various fractal dimensions obtained from gray-scale SEM micrographs and binary images resulting from median filtering of the original SEM micrographs as well as selected relevant roughness parameters shows that there is a strong correlation between certain roughness parameters and particular fractal dimensions. This correlations permit better physical understanding of fractal characteristics and interpretation of the dynamics of surface roughness change through processing. Generally these correlations are more suitable for parameters obtained by stylus method than those inferred from the laser-based measurements.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2007.11.040