Localisation of trace metals in metal-accumulating plants using µ-PIXE

Particle induced x‐ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high‐resolution mapp...

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Bibliographic Details
Published in:X-ray spectrometry 2008-03, Vol.37 (2), p.133-136
Main Authors: Siegele, R., Kachenko, A. G., Bhatia, N. P., Wang, Y. D., Ionescu, M., Singh, B., Baker, A. J. M., Cohen, D. D.
Format: Article
Language:English
Subjects:
Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
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Summary:Particle induced x‐ray emission (PIXE) is a very sensitive technique that can quickly and reliably measure a wide range of elements simultaneously with high sensitivity. Using a focused microbeam, elemental distributions can be mapped with high spatial resolution. We demonstrate high‐resolution mapping of metals in plant leaves at 5 µm resolution and its application in detecting sites of metal accumulation in metal‐accumulating plant tissues. The importance of biological sample preparation is discussed by direct comparison of freeze‐substitution and freeze‐drying techniques routinely used in biological sciences. The advantages and limitations of quantitative elemental imaging using these techniques are also discussed. Copyright © 2008 John Wiley & Sons, Ltd.
ISSN:0049-8246
1097-4539
DOI:10.1002/xrs.1035