Buckling of a stiff thin film on a compliant substrate in large deformation

A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and...

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Bibliographic Details
Published in:International journal of solids and structures 2008-05, Vol.45 (10), p.3107-3121
Main Authors: Song, J., Jiang, H., Liu, Z.J., Khang, D.Y., Huang, Y., Rogers, J.A., Lu, C., Koh, C.G.
Format: Article
Language:English
Subjects:
Buckling
Finite deformation
Finite element analysis
Perturbation analysis
Thin film
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Summary:A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically.
ISSN:0020-7683
1879-2146
DOI:10.1016/j.ijsolstr.2008.01.023