Growth and characterization of tetragonal bismuth ferrite–lead titanate thin films

Thin films of tetragonal bismuth ferrite–lead titanate (1−x)BiFeO3–xPbTiO3 with x=0.9–0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (111) texture. The film m...

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Bibliographic Details
Published in:Acta materialia 2008-05, Vol.56 (9), p.2110-2118
Main Authors: Khan, Mikael A., Comyn, Tim P., Bell, Andrew J.
Format: Article
Language:English
Subjects:
Applied sciences
Bismuth
Columns (structural)
Cross-disciplinary physics: materials science
rheology
Electroceramics
Exact sciences and technology
Ferroelectricity
Laser deposition
Materials science
Metals. Metallurgy
Methods of deposition of films and coatings
film growth and epitaxy
Perovskite structure
Perovskites
Physics
Polarization
Production techniques
Surface layer
Surface treatment
Texture
Thin films
Titanates
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Summary:Thin films of tetragonal bismuth ferrite–lead titanate (1−x)BiFeO3–xPbTiO3 with x=0.9–0.7 were prepared by pulsed laser deposition (PLD). The films exhibit a dense columnar grain growth. XRD analysis reveals that the films have a perovskite structure and exhibit a preferred (111) texture. The film microstructure was studied using SEM. The ferroelectric properties of the films are discussed in the light of polarization-field hysteresis behaviour and impedance spectroscopy. The remanent polarization values ranged between 2Pr∼45 and ∼60μCcm−2 at a field amplitude of 500kVcm−1 and −10°C, while the dielectric permittivity of the films ranged between 375 and 1096 at a frequency of 2kHz.
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2008.01.008