Growth and physical properties of ZnxCd1-xO thin films prepared by spray pyrolysis technique

Thin films of ZnxCd1-xO have been deposited by spray pyrolysis technique. The preparative parameters were optimized to obtain good quality of thin films. The as-deposited thin films were characterized for structural, compositional, surface morphological and optical properties. An XRD pattern shows p...

Full description

Saved in:
Bibliographic Details
Published in:Journal of alloys and compounds 2008-09, Vol.463 (1-2), p.576-580
Main Authors: DEVSHETTE, P. M, DESHPANDE, N. G, BICHILE, G. K
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Ii-vi semiconductors
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of specific thin films
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Thin films of ZnxCd1-xO have been deposited by spray pyrolysis technique. The preparative parameters were optimized to obtain good quality of thin films. The as-deposited thin films were characterized for structural, compositional, surface morphological and optical properties. An XRD pattern shows polycrystalline nature. As x varies from x = 0.0 to 1.0, it was observed that the crystal structure changes from rock salt cubic (CdO) to wurtzite (ZnO) structure. EDAX spectra were used to study the composition of the ternary semiconductor compound (ZnxCd1-xO) thin films. Uniform grain distribution over entire glass substrate was seen from the SEM micrographs. A significant change in optical absorption edge with variation in composition was observed. Nearly, linear variation of band gap was seen with respect to the change in the composition x.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2007.10.147