Structure and dielectric properties of Bi5−xLaxNb3O15 ceramics

Bi 5− x La x Nb 3 O 15 ( x  = 0– 1.25) ceramics prepared by conventional solid-state reaction were studied using X-ray diffraction (XRD), electron probe microanalysis (EPMA) and dielectric spectroscopy techniques. The XRD analysis indicated single phase solid solution of Bi 5− x La x Nb 3 O 15 is fo...

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Bibliographic Details
Published in:Journal of electroceramics 2008-12, Vol.21 (1-4), p.319-322
Main Authors: Yi, Zhiguo, Li, Yongxiang, Zeng, Jiangtao, Yang, Qunbao, Yin, Qingrui
Format: Article
Language:English
Subjects:
Applied sciences
Building materials. Ceramics. Glasses
Ceramic industries
Ceramics
Characterization and Evaluation of Materials
Chemical industry and chemicals
Chemistry and Materials Science
Composites
Crystallography and Scattering Methods
Electrochemistry
Electrotechnical and electronic ceramics
Exact sciences and technology
Glass
Materials Science
Natural Materials
Optical and Electronic Materials
Technical ceramics
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Summary:Bi 5− x La x Nb 3 O 15 ( x  = 0– 1.25) ceramics prepared by conventional solid-state reaction were studied using X-ray diffraction (XRD), electron probe microanalysis (EPMA) and dielectric spectroscopy techniques. The XRD analysis indicated single phase solid solution of Bi 5− x La x Nb 3 O 15 is formed for x  ≤ 1.25. EPMA showed good densification and homogeneous microstructures for the ceramics. With increasing x , the dielectric constant decreases monotonously and can vary from 258 to 158 at 300 kHz. The frequency dependence of dielectric constants indicated these ceramics are promising candidates for high frequency applications.
ISSN:1385-3449
1573-8663
DOI:10.1007/s10832-007-9162-y