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Electrical characteristics of Mg-doped GaAs epitaxial layers grown by molecular beam epitaxy

The electrical characteristics of magnesium (Mg)-doped GaAs epitaxial layers grown with different substrate temperatures have been investigated by Hall effect and capacitance–voltage ( C– V) measurements at room temperature. The carrier concentration obtained by Hall measurements was decreased from...

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Bibliographic Details
Published in:Journal of crystal growth 2008-05, Vol.310 (10), p.2427-2431
Main Authors: Park, Ho Jin, Kim, Jongho, Kim, Min Su, Kim, Do Yeob, Kim, Jong Su, Kim, Jin Soo, Son, J.S., Ryu, H.H., Cho, Guan Sik, Jeon, Minhyon, Leem, J.Y.
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Language:English
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Summary:The electrical characteristics of magnesium (Mg)-doped GaAs epitaxial layers grown with different substrate temperatures have been investigated by Hall effect and capacitance–voltage ( C– V) measurements at room temperature. The carrier concentration obtained by Hall measurements was decreased from 1.4×10 19 to 3.4×10 16 cm −3 when increasing the substrate temperature in the range 460–540 °C, and thus the maximum attainable doping density was N A– N D=1.4×10 19 cm −3. The depth profiles of doping density, obtained by C– V measurements, show that carriers largely out-diffused toward the surface. This could be attributed to the surface segregation effect, which was predominant in the samples with a high doping density than those with a low doping density. Mg-doped GaAs layers have higher mobility than Be-doped GaAs layers around N A– N D=10 18 cm −3. Thus, it is expected that Mg could be effectively used as p-type dopants for highly doped nanostructured semiconductors.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2007.12.064