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Electrical characteristics of Mg-doped GaAs epitaxial layers grown by molecular beam epitaxy
The electrical characteristics of magnesium (Mg)-doped GaAs epitaxial layers grown with different substrate temperatures have been investigated by Hall effect and capacitance–voltage ( C– V) measurements at room temperature. The carrier concentration obtained by Hall measurements was decreased from...
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Published in: | Journal of crystal growth 2008-05, Vol.310 (10), p.2427-2431 |
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Main Authors: | , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The electrical characteristics of magnesium (Mg)-doped GaAs epitaxial layers grown with different substrate temperatures have been investigated by Hall effect and capacitance–voltage (
C–
V) measurements at room temperature. The carrier concentration obtained by Hall measurements was decreased from 1.4×10
19 to 3.4×10
16
cm
−3 when increasing the substrate temperature in the range 460–540
°C, and thus the maximum attainable doping density was
N
A–
N
D=1.4×10
19
cm
−3. The depth profiles of doping density, obtained by
C–
V measurements, show that carriers largely out-diffused toward the surface. This could be attributed to the surface segregation effect, which was predominant in the samples with a high doping density than those with a low doping density. Mg-doped GaAs layers have higher mobility than Be-doped GaAs layers around
N
A–
N
D=10
18
cm
−3. Thus, it is expected that Mg could be effectively used as p-type dopants for highly doped nanostructured semiconductors. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/j.jcrysgro.2007.12.064 |