Integrated carbon nanotube field emission differential amplifier: Modeling and measurement of the common-mode rejection ratio

• Published in: Diamond and related materials 2008-04, Vol.17 (4), p.552-555
• Main Authors: Wong, Y.M., Kang, W.P., Davidson, J.L., Huang, J.H., Kerns, D.V.
• Format: Article
• Language: English
• Subjects: Applied sciences; Carbon nanotubes; CMRR; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Differential amplifier; Electron and ion emission by liquids and solids; impact phenomena; Electronics; Exact sciences and technology; Field emission; Field emission, ionization, evaporation, and desorption; Materials science; Molecular electronics, nanoelectronics; Nanoscale materials and structures: fabrication and characterization; Nanotubes; Physics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Triode
• ISSN: 0925-9635; 1879-0062
• DOI: 10.1016/j.diamond.2007.12.026

A novel integrated vacuum field emission (VFE) differential amplifier (diff-amp) utilizing carbon nanotube (CNT) emitters has been developed. A dual-mask microfabrication process was employed to achieve a VFE diff-amp by integrating identical CNT VFE transistors with built-in split gates and integrated anodes. The identical pair of triode amplifiers was well-matched in their device characteristics. The measured ac small-signal characteristics of the diff-amp showed a common-mode-rejection ratio (CMRR) of ~ 320 (~ 50 dB). The proposed analytical model of the CMRR was verified to be in good agreement with the experimental data. The successful implementation of the CNT diff-amp demonstrates a new way to achieve temperature and radiation tolerant VFE integrated microelectronics.