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Nanodiamond film with ‘ridge’ surface profile for chemical sensing

A nanodiamond film with ‘ridge’ surface morphology was grown on highly doped n-type silicon substrate by microwave plasma enhanced chemical vapor deposition (MPECVD) using a H 2/CH 4/N 2 gas mixture. The nanodiamond electrode was electrochemically characterized by cyclic voltammetry using various co...

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Bibliographic Details
Published in:Diamond and related materials 2008-04, Vol.17 (4), p.896-899
Main Authors: Raina, Supil, Kang, W.P., Davidson, J.L.
Format: Article
Language:English
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Summary:A nanodiamond film with ‘ridge’ surface morphology was grown on highly doped n-type silicon substrate by microwave plasma enhanced chemical vapor deposition (MPECVD) using a H 2/CH 4/N 2 gas mixture. The nanodiamond electrode was electrochemically characterized by cyclic voltammetry using various concentrations of ferrocyanide in a background of 0.1 M KCl. The results show a wide working potential window of ~ 3 V, quasi-reversible kinetics with a high signal to noise S/B ratio. The peak current increases linearly with increasing concentration of ferrocyanide. Also, the peak current varies linearly with the square root of scan rate indicating planar diffusion dominated mass transport. The nanodiamond electrode exhibits excellent structure stability and electrochemical behavior without any surface pretreatment, indicating it is an excellent candidate for electrochemical sensing.
ISSN:0925-9635
1879-0062
DOI:10.1016/j.diamond.2007.12.027