XPS Research on SrTiO3-Based Voltage-Sensitive Material

SrTiO3-based voltage-sensitive material was prepared successfully. The structure and properties were investigated using scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy. It was observed that the average grain size was greater than 3μm and a cubic perovskite struct...

Full description

Saved in:
Bibliographic Details
Published in:Key engineering materials 2008-01, Vol.368-372, p.535-537
Main Authors: Tang, Zi Long, Zhang, Zhong Tai, Xu, Yu Xing
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:SrTiO3-based voltage-sensitive material was prepared successfully. The structure and properties were investigated using scanning electron microscopy, X-ray diffraction and X-ray photoelectron spectroscopy. It was observed that the average grain size was greater than 3μm and a cubic perovskite structure was obtained. XPS analysis of oxygen indicated that there existed multiform chemical state oxygen at the surface of the grain. Further researches shown that there were a few [AO12] polyhedrons and many cation vacancies in the material discussed, which demonstrated that a lot of oxygen volatilized and a well-known semiconductivity level was achieved.
ISSN:1013-9826
1662-9795
1662-9795
DOI:10.4028/www.scientific.net/KEM.368-372.535