Structural, optical and electrical characterization of undoped ZnMgO film grown by spray pyrolysis method

Undoped Zn 1− X Mg X O poly crystalline films were successfully grown by a spray pyrolysis method at 500 °C. The samples indicated high quality because (0002) orientation was strongly observed in the X-ray diffraction (XRD) pattern below Mg content X  = 0.3. A lattice constant of c axis decreased li...

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2008-02, Vol.19 (2), p.203-209
Main Authors: Yoshino, K., Oyama, S., Yoneta, M.
Format: Article
Language:English
Subjects:
Applied sciences
Characterization and Evaluation of Materials
Chemistry and Materials Science
Cross-disciplinary physics: materials science
rheology
Crystal structure
Diffraction
Diffraction patterns
Electronics
Exact sciences and technology
Lattice parameters
Magnesium
Materials
Materials Science
Methods of deposition of films and coatings
film growth and epitaxy
Optical and Electronic Materials
Orientation
Physics
Spray coating techniques
Spray pyrolysis
X-rays
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Description
Summary:Undoped Zn 1− X Mg X O poly crystalline films were successfully grown by a spray pyrolysis method at 500 °C. The samples indicated high quality because (0002) orientation was strongly observed in the X-ray diffraction (XRD) pattern below Mg content X  = 0.3. A lattice constant of c axis decreased linearly with increasing Mg content, indicating that the lattice constant of c axis followed Vegard’s law. It was deduced that Mg atoms could be successfully substituted in Zn site from lattice constants and optical bandgap.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-007-9333-2