X-ray absorption spectroscopy and X-ray diffraction analysis of crystalline CoTi2 grown by DC co-sputtering : A theoretical and experimental comparison

A series of thin films were grown at 500 deg C with a Co and Ti base on silicon substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110 W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analy...

Full description

Saved in:
Bibliographic Details
Published in:Journal of alloys and compounds 2009-04, Vol.474 (1-2), p.283-286
Main Authors: YOCUPICIO-VILLEGAS, I, ESPARZA-PONCE, H. E, DUARTE-MÖLLER, A
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A series of thin films were grown at 500 deg C with a Co and Ti base on silicon substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110 W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analyses were also performed in order to compare simulated results with experimental results. The X-ray diffraction and atomic absorption results reveal a CoTi2 (Fd-3ms) and Ti (P63/mmc) phase, while extended X-ray absorption fine structure spectroscopy shows slight variations in the coordination numbers and distances from close neighbors and have 0-7% deviations. The results showed good agreement between the theoretical and experimental results.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2008.06.129