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Perovskite BaHfO3 Dielectric Layers for Dynamic Random Access Memory Storage Capacitor Applications

Very thin layers of dielectric materials are of high importance for many advanced microelectronic applications. In this work, properties of very thin (

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Bibliographic Details
Published in:Advanced engineering materials 2009-04, Vol.11 (4), p.259-264
Main Authors: Lupina, Grzegorz, Dabrowski, Jarek, Dudek, Piotr, Kozlowski, Grzegorz, Lukosius, Mindaugas, Wenger, Christian, Müssig, Hans-Joachim
Format: Article
Language:English
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Description
Summary:Very thin layers of dielectric materials are of high importance for many advanced microelectronic applications. In this work, properties of very thin (
ISSN:1438-1656
1527-2648
DOI:10.1002/adem.200800296