Spatially Resolved Characterization of the Coherence Area in the Incoherent Emission Regime of a Broad-Area Vertical-Cavity Surface-Emitting Laser

We present direct measurements of the spatial coherence area of a pulsed broad-area vertical-cavity surface-emitting laser using a reversing wavefront interferometer. With this technique, we can assess the size and uniformity of the coherence area across the laser aperture, being of importance for p...

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Bibliographic Details
Published in:IEEE journal of quantum electronics 2009-03, Vol.45 (3), p.249-255
Main Authors: Verschaffelt, G., Craggs, G., Peeters, M., Mandre, S.K., Thienpont, H., Fischer, I.
Format: Article
Language:English
Subjects:
Apertures
Area measurement
Beams (radiation)
Coherence
Emission
Interferometers
Laser beams
Lasers
Optical pulses
Pulse measurements
Semiconductor laser
Spatial coherence
Spatial resolution
Surface emitting lasers
Surface waves
Variability
Vertical cavity surface emission lasers
Vertical cavity surface emitting lasers
vertical-cavity surface-emitting laser (VCSEL)
Wave fronts
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Description
Summary:We present direct measurements of the spatial coherence area of a pulsed broad-area vertical-cavity surface-emitting laser using a reversing wavefront interferometer. With this technique, we can assess the size and uniformity of the coherence area across the laser aperture, being of importance for projection applications. We show that the output beam can be considered quasi-homogeneous and that the measured coherence area corresponds well with the coherence area deduced from the far-field emission profile. We demonstrate that the coherence area is limited in size by the radial temperature gradient in the device and discuss the origin of coherence variations.
ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2009.2013085