Determination of electron inelastic mean free paths for poly[methyl(phenyl)silylene] films

The inelastic mean free paths (IMFPs) of electrons at a poly[methyl(phenyl)silylene] thin film surface were determined using elastic peak electron spectroscopy (EPES) and Monte Carlo calculations for a wide electron energy range, 200–1600 eV. We considered the surface composition determined from X-r...

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Bibliographic Details
Published in:Polymer (Guilford) 2009-05, Vol.50 (11), p.2445-2450
Main Authors: Zemek, J., Houdkova, J., Jiricek, P., Jablonski, A., Jurka, V., Kub, J.
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Inelastic mean free path
Inorganic and organomineral polymers
Physicochemistry of polymers
Poly[methyl(phenyl)silylene]
Polymer physics
Properties and characterization
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Summary:The inelastic mean free paths (IMFPs) of electrons at a poly[methyl(phenyl)silylene] thin film surface were determined using elastic peak electron spectroscopy (EPES) and Monte Carlo calculations for a wide electron energy range, 200–1600 eV. We considered the surface composition determined from X-ray induced photoelectron spectra (XPS), the hydrogen concentration evaluated by EPES, and a correction for surface excitations. The results compare well to those calculated from the predictive TPP-2M and G1, formulae. Calculations carried out with the quantitative structure–property relationship of Cumpson and the formula of Ashley and Williams provide larger IMFP values, and can be useful only for a rough estimation. ▪
ISSN:0032-3861
1873-2291
DOI:10.1016/j.polymer.2009.03.031