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Fabrication and Characterization of Fully Epitaxial Magnetic Tunnel Junction Field Sensors Using a Thin Film
Fully epitaxial magnetic tunnel junctions (MTJs) consisting of a Co 2 MnSi (CMS) upper free layer, a MgO tunnel barrier, and a Co 50 Fe 50 lower pinned layer were fabricated for sensor application. The fabricated MTJs exhibited clear exchange-biased tunnel magnetoresistance (TMR) characteristics wit...
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Published in: | IEEE transactions on magnetics 2008-11, Vol.44 (11), p.3996-3998 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Fully epitaxial magnetic tunnel junctions (MTJs) consisting of a Co 2 MnSi (CMS) upper free layer, a MgO tunnel barrier, and a Co 50 Fe 50 lower pinned layer were fabricated for sensor application. The fabricated MTJs exhibited clear exchange-biased tunnel magnetoresistance (TMR) characteristics with a relatively high TMR ratios of 94% at room temperature (209% at 4.2 K) with V half of approximately - 0.52 and + 0.54 V. Almost hysteresis-free TMR characteristics with sensitivity of approximately 0.4%/Oe were obtained with a cross magnetization configuration, in which the magnetization of the CMS free layer was oriented perpendicularly to that of the pinned layer. |
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ISSN: | 0018-9464 1941-0069 |
DOI: | 10.1109/TMAG.2008.2003540 |