A universal scaling law for the strength of metal micropillars and nanowires

The yield strength of sub-micron single-crystal metal pillars and wires increases with decreasing pillar diameter. Here, we show that the yield stress (resolved onto a slip system), σ rss , scaled by shear modulus, μ, and the diameter, d, scaled by Burgers vector, b, shows the following universal co...

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Bibliographic Details
Published in:Scripta materialia 2009-09, Vol.61 (5), p.524-527
Main Authors: Dou, R., Derby, B.
Format: Article
Language:English
Subjects:
Nanocrystalline materials
Plastic deformation
Size effect
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Summary:The yield strength of sub-micron single-crystal metal pillars and wires increases with decreasing pillar diameter. Here, we show that the yield stress (resolved onto a slip system), σ rss , scaled by shear modulus, μ, and the diameter, d, scaled by Burgers vector, b, shows the following universal correlation: σ rss / μ = A ( d / b ) m ; for face-centred cubic (fcc) metals A = 0.71 and m = −0.66. Data for Mo and a Mo alloy are found to approximately obey the fcc correlation, despite having a different crystal structure.
ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2009.05.012