Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers

The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the...

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Bibliographic Details
Published in:Crystal research and technology (1979) 2001-10, Vol.36 (8-10), p.1045-1057
Main Authors: Kunert, H. W., Lavitska, E.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Mechanical and acoustical properties
overlayer
Physical properties of thin films, nonelectronic
Physics
stiffness constants
strain
stress
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Summary:The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.
ISSN:0232-1300
1521-4079
DOI:10.1002/1521-4079(200110)36:8/10<1045::AID-CRAT1045>3.0.CO;2-K