Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers

The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the...

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Published in:Crystal research and technology (1979) 2001-10, Vol.36 (8-10), p.1045-1057
Main Authors: Kunert, H. W., Lavitska, E.
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Mechanical and acoustical properties
overlayer
Physical properties of thin films, nonelectronic
Physics
stiffness constants
strain
stress
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Lavitska, E.
description The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.
doi_str_mv 10.1002/1521-4079(200110)36:8/10<1045::AID-CRAT1045>3.0.CO;2-K
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_34696671</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>34696671</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4155-b47db49af6268c5592687ac8aece3f72b4e57e57d9488a7aba025e59ebba3df03</originalsourceid><addsrcrecordid>eNqVkE9vEzEQxS0EEqHwHfYCgsOm4_-7ARWFLaQlhUg0hQOHkdfxCpftbrCTQr49jraEEwcky6Pxe_PG-hFyQmFMAdgxlYzmAnT5nAFQCi-4mhTHFF5REHIymZ6f5tWn6XLfnfAxjKvFS5bP75HRYfA-GQHjLKcc4CF5FOM1AJRKsBF5fbkJLkYXM9OtstQY38XMd9m087HfhH7tbVZt63RftUnNl9-SuLh1oTU7F-Jj8qAxbXRP7uoRuXr3dlmd5ReL2Xk1vcitoFLmtdCrWpSmUUwVVsoyFW1sYZx1vNGsFk7qdFalKAqjTW2ASSdLV9eGrxrgR-TZkLsO_Y-tixu88dG6tjWd67cRuVClUpom4-fBaEMfY3ANroO_MWGHFHDPE_dYcI8FB57IFRaDKiRi4ol_eCJHwGqBDOcp-OndD0y0pm2C6ayPf9MFKEl1kXxfB99P37rdf27_x_LDW0rPh3QfN-7XId2E76g01xK_fJwl9-zs_eWHOb7hvwHA_6Qh</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>34696671</pqid></control><display><type>article</type><title>Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers</title><source>Wiley-Blackwell Read &amp; Publish Collection</source><creator>Kunert, H. W. ; Lavitska, E.</creator><creatorcontrib>Kunert, H. W. ; Lavitska, E.</creatorcontrib><description>The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.</description><identifier>ISSN: 0232-1300</identifier><identifier>EISSN: 1521-4079</identifier><identifier>DOI: 10.1002/1521-4079(200110)36:8/10&lt;1045::AID-CRAT1045&gt;3.0.CO;2-K</identifier><identifier>CODEN: CRTEDF</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag Berlin GmbH</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Mechanical and acoustical properties ; overlayer ; Physical properties of thin films, nonelectronic ; Physics ; stiffness constants ; strain ; stress ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><ispartof>Crystal research and technology (1979), 2001-10, Vol.36 (8-10), p.1045-1057</ispartof><rights>2001 WILEY‐VCH Verlag Berlin GmbH, Fed. Rep. of Germany</rights><rights>2002 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c4155-b47db49af6268c5592687ac8aece3f72b4e57e57d9488a7aba025e59ebba3df03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,780,784,789,790,23930,23931,25140,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=14065178$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kunert, H. W.</creatorcontrib><creatorcontrib>Lavitska, E.</creatorcontrib><title>Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers</title><title>Crystal research and technology (1979)</title><addtitle>Cryst. Res. Technol</addtitle><description>The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Mechanical and acoustical properties</subject><subject>overlayer</subject><subject>Physical properties of thin films, nonelectronic</subject><subject>Physics</subject><subject>stiffness constants</subject><subject>strain</subject><subject>stress</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0232-1300</issn><issn>1521-4079</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2001</creationdate><recordtype>article</recordtype><recordid>eNqVkE9vEzEQxS0EEqHwHfYCgsOm4_-7ARWFLaQlhUg0hQOHkdfxCpftbrCTQr49jraEEwcky6Pxe_PG-hFyQmFMAdgxlYzmAnT5nAFQCi-4mhTHFF5REHIymZ6f5tWn6XLfnfAxjKvFS5bP75HRYfA-GQHjLKcc4CF5FOM1AJRKsBF5fbkJLkYXM9OtstQY38XMd9m087HfhH7tbVZt63RftUnNl9-SuLh1oTU7F-Jj8qAxbXRP7uoRuXr3dlmd5ReL2Xk1vcitoFLmtdCrWpSmUUwVVsoyFW1sYZx1vNGsFk7qdFalKAqjTW2ASSdLV9eGrxrgR-TZkLsO_Y-tixu88dG6tjWd67cRuVClUpom4-fBaEMfY3ANroO_MWGHFHDPE_dYcI8FB57IFRaDKiRi4ol_eCJHwGqBDOcp-OndD0y0pm2C6ayPf9MFKEl1kXxfB99P37rdf27_x_LDW0rPh3QfN-7XId2E76g01xK_fJwl9-zs_eWHOb7hvwHA_6Qh</recordid><startdate>200110</startdate><enddate>200110</enddate><creator>Kunert, H. W.</creator><creator>Lavitska, E.</creator><general>WILEY-VCH Verlag Berlin GmbH</general><general>WILEY‐VCH Verlag Berlin GmbH</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>200110</creationdate><title>Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers</title><author>Kunert, H. W. ; Lavitska, E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4155-b47db49af6268c5592687ac8aece3f72b4e57e57d9488a7aba025e59ebba3df03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2001</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Mechanical and acoustical properties</topic><topic>overlayer</topic><topic>Physical properties of thin films, nonelectronic</topic><topic>Physics</topic><topic>stiffness constants</topic><topic>strain</topic><topic>stress</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kunert, H. W.</creatorcontrib><creatorcontrib>Lavitska, E.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Crystal research and technology (1979)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kunert, H. W.</au><au>Lavitska, E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers</atitle><jtitle>Crystal research and technology (1979)</jtitle><addtitle>Cryst. Res. Technol</addtitle><date>2001-10</date><risdate>2001</risdate><volume>36</volume><issue>8-10</issue><spage>1045</spage><epage>1057</epage><pages>1045-1057</pages><issn>0232-1300</issn><eissn>1521-4079</eissn><coden>CRTEDF</coden><abstract>The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag Berlin GmbH</pub><doi>10.1002/1521-4079(200110)36:8/10&lt;1045::AID-CRAT1045&gt;3.0.CO;2-K</doi><tpages>13</tpages></addata></record>
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1521-4079
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source Wiley-Blackwell Read & Publish Collection
subjects Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Mechanical and acoustical properties
overlayer
Physical properties of thin films, nonelectronic
Physics
stiffness constants
strain
stress
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
title Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T12%3A13%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Stresses%20and%20Strains%20in%20Anisotropic%20Cubic%20Ultra-Thin%20Overlayers&rft.jtitle=Crystal%20research%20and%20technology%20(1979)&rft.au=Kunert,%20H.%20W.&rft.date=2001-10&rft.volume=36&rft.issue=8-10&rft.spage=1045&rft.epage=1057&rft.pages=1045-1057&rft.issn=0232-1300&rft.eissn=1521-4079&rft.coden=CRTEDF&rft_id=info:doi/10.1002/1521-4079(200110)36:8/10%3C1045::AID-CRAT1045%3E3.0.CO;2-K&rft_dat=%3Cproquest_cross%3E34696671%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c4155-b47db49af6268c5592687ac8aece3f72b4e57e57d9488a7aba025e59ebba3df03%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=34696671&rft_id=info:pmid/&rfr_iscdi=true