Study of the morphology of ultra-thin Pt films as the anode of an organic light emitting display

An ultra-thin Pt layer could be used as a transparent conducting anode to replace the ITO used today in a top-emitting OLED. A proper thickness of Pt thin layer is needed to avoid large leakage current while still keeping the high transparency for visible light. X-ray reflectivity and AFM were used...

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Bibliographic Details
Published in:Thin solid films 2009-07, Vol.517 (17), p.5116-5119
Main Authors: Lee, Chih-Hao, Tzeng, Yao-Dong
Format: Article
Language:English
Subjects:
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Electronics
Exact sciences and technology
OLED
Optoelectronic devices
Physics
Pt thin film
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Sheet resistance
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
X-ray reflectivity
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Summary:An ultra-thin Pt layer could be used as a transparent conducting anode to replace the ITO used today in a top-emitting OLED. A proper thickness of Pt thin layer is needed to avoid large leakage current while still keeping the high transparency for visible light. X-ray reflectivity and AFM were used to measure the morphology of e-gun deposition Pt thin films grown on glass substrates. The islands grown on the glass coalesced at the thickness of less than 4 nm. For the sample of 4 nm thickness, the sheet resistance is 800 Ω/□ with a transparency of 65%.
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2009.03.128