The Effect of Structural Defects on Magnetic Switching in Thin Ferromagnetic Patterned Films

We have utilized micromagnetic simulations to study the effect of structural defects on the magnetic switching behavior of thin elliptical permalloy films. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which changes the local equilibrium magnetization configurations and...

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Bibliographic Details
Published in:IEEE transactions on magnetics 2007-02, Vol.43 (2), p.923-926
Main Authors: Chang, C.-R., Jyh-Shinn Yang
Format: Article
Language:English
Subjects:
Cross-disciplinary physics: materials science
rheology
Defects
Exact sciences and technology
Ferromagnetic materials
Magnetic devices
Magnetic films
Magnetic materials
Magnetic properties
Magnetic switching
Magnetism
Magnetization
Magnetization reversal
Magnetosphere
Materials science
micromagnetic simulations
Micromagnetics
Other topics in materials science
patterned films
Physics
Robustness
Shape
Simulation
structural defects
Switching
Thin films
Voids
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Summary:We have utilized micromagnetic simulations to study the effect of structural defects on the magnetic switching behavior of thin elliptical permalloy films. The nonmagnetic void was found to tend to pin the adjacent magnetic moment, which changes the local equilibrium magnetization configurations and alters the switching behavior of magnetization, leading to a large variation in switching fields. In particular, for the case of voids close to the edge, the curling effect of voids is significant and induces the occurrence of the multiple-stage magnetization reversal, leading to significantly large switching fields
ISSN:0018-9464
1941-0069
DOI:10.1109/TMAG.2006.888515