Buckling patterns of gold thin films on silicon substrates: Formation of superimposed blisters

Buckling phenomena leading to the formation of superimposed blisters have been experimentally observed with the help of a confocal interferometric microscope onto the surface of gold thin films deposited on silicon substrates. Assuming that residual folding effects resulting from plastic deformation...

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Bibliographic Details
Published in:Europhysics letters 2009-06, Vol.86 (5), p.54002
Main Authors: Colin, J, Coupeau, C, Durinck, J, Grilhé, J
Format: Article
Language:English
Subjects:
46.32.+x
61.72.Lk
68.55.-a
Condensed Matter
Materials Science
Physics
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Summary:Buckling phenomena leading to the formation of superimposed blisters have been experimentally observed with the help of a confocal interferometric microscope onto the surface of gold thin films deposited on silicon substrates. Assuming that residual folding effects resulting from plastic deformation mechanisms take place in the film during its morphological evolution, different probable scenarios for the formation of the observed buckling patterns are elaborated in the framework of the Föppl-von Karman's theory of thin plates. Multi-step buckling with growing interface delamination is considered for the first scenario while a single or multi-step buckling at a given delamination width is assumed for the other ones.
ISSN:0295-5075
1286-4854
DOI:10.1209/0295-5075/86/54002